The use and abuse of HASTSINNADURAI, N.ESA SP (Print). 1997, pp 375-379, issn 0379-6566, isbn 92-9092-263-XConference Paper

Mixed L.F./R.F. MCMDREVON, C; GEORGE, S; COELLO VERA, A et al.ESA SP (Print). 1997, pp 183-187, issn 0379-6566, isbn 92-9092-263-XConference Paper

EECC'97 : third ESA electronic components conference (Noordwijk, 22-25 April 1997)ESA SP (Print). 1997, issn 0379-6566, isbn 92-9092-263-X, XI, 548 p, isbn 92-9092-263-XConference Proceedings

Procurement approach in the ERA projectLIEBLER, T; TORENBEEK, R.ESA SP (Print). 1997, pp 85-89, issn 0379-6566, isbn 92-9092-263-XConference Paper

ESA radiation effects databaseHYMERS, R; TURNER, I. C.ESA SP (Print). 1997, pp 479-480, issn 0379-6566, isbn 92-9092-263-XConference Paper

From microengineering to nanotechnologyWHATMORE, R. W.ESA SP (Print). 1997, pp 7-21, issn 0379-6566, isbn 92-9092-263-XConference Paper

MKT-S capacitors for aerospaceMÜNCH, R.ESA SP (Print). 1997, pp 395-397, issn 0379-6566, isbn 92-9092-263-XConference Paper

The European initiative for space componentsSOONS, A. F. L.ESA SP (Print). 1997, pp 97-105, issn 0379-6566, isbn 92-9092-263-XConference Paper

The QML approach to space applicationsKERR, G.ESA SP (Print). 1997, pp 65-69, issn 0379-6566, isbn 92-9092-263-XConference Paper

Using commercial components in the space environmentMEINGUSS, A.ESA SP (Print). 1997, pp 121-124, issn 0379-6566, isbn 92-9092-263-XConference Paper

Improving reliability of electronic assemblies using early physical and electrical indicatorsOUSTEN, Y; DANTO, Y; BECHOU, L et al.ESA SP (Print). 1997, pp 195-198, issn 0379-6566, isbn 92-9092-263-XConference Paper

Preliminary reliability evaluation of flip chip on flex interconnect technologySHAW, J. J; VIRMANI, N.ESA SP (Print). 1997, pp 205-212, issn 0379-6566, isbn 92-9092-263-XConference Paper

Thermal behaviour of filamentary fuses under space environmentCOSQUERIC, L; ROUX, B; JING LI et al.ESA SP (Print). 1997, pp 295-298, issn 0379-6566, isbn 92-9092-263-XConference Paper

Future high power semiconductor microwave devicesMYERS, F.ESA SP (Print). 1997, pp 539-544, issn 0379-6566, isbn 92-9092-263-XConference Paper

Gold aluminium intermetallics current and future considerationsJONES, J. A.ESA SP (Print). 1997, pp 411-415, issn 0379-6566, isbn 92-9092-263-XConference Paper

Hardness variability on linear bipolar devicesDOUCIN, B; GACH, A; POIVEY, C et al.ESA SP (Print). 1997, pp 457-460, issn 0379-6566, isbn 92-9092-263-XConference Paper

Boundary scan : Moving test up to higher integration levelsSTEARNS, B. S.ESA SP (Print). 1997, pp 351-355, issn 0379-6566, isbn 92-9092-263-XConference Paper

CCD reliability and failure mechanisms studyGIRAUD, B; VAILLANT, J.ESA SP (Print). 1997, pp 269-274, issn 0379-6566, isbn 92-9092-263-XConference Paper

ERC32 radiation tolerant RISC processor ; tolerance to radiationCORBIERE, T; GAISLER, G.ESA SP (Print). 1997, pp 475-478, issn 0379-6566, isbn 92-9092-263-XConference Paper

Known good die : Flexible solutions for spaceWAKEFIELD, P.ESA SP (Print). 1997, pp 421-424, issn 0379-6566, isbn 92-9092-263-XConference Paper

Radiation performance of space application bipolar voltage reference ICsVAQUERO, J. A; FERNANDEZ, G; GUTIERREZ, F et al.ESA SP (Print). 1997, pp 449-455, issn 0379-6566, isbn 92-9092-263-XConference Paper

The impact of passive intermodulation on specifying and characterising componentsPETIT, J. S; RAWLINS, A. D.ESA SP (Print). 1997, pp 45-49, issn 0379-6566, isbn 92-9092-263-XConference Paper

An assessment of long term degradation mechanisms in GaAs MMICsLINDSAY, C. E; CONLON, R. F. B; BOLBOT, P. H et al.ESA SP (Print). 1997, pp 41-44, issn 0379-6566, isbn 92-9092-263-XConference Paper

Application of field programmable gate arrays to space projectsCHIBA, K; SAKAIDE, Y; KUBOYAMA, S et al.ESA SP (Print). 1997, pp 471-474, issn 0379-6566, isbn 92-9092-263-XConference Paper

Evaluation of a photo-imageable multilayer thick film technologyCAZENAVE, J. P; PUIG, O.ESA SP (Print). 1997, pp 177-181, issn 0379-6566, isbn 92-9092-263-XConference Paper